Opented
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
View official noticeContracting authority
Danmarks Tekniske Universitet - DTU
Estimated value
—
Submission deadline
16 Nov 2026, 08:00
Location
Københavns omegn
Notice details
- Published:
- 1 Jan 2026
- Country:
- DK
CPV codes
385111003851100038512100
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